Creep behavior evaluation and characterization of SiC film with Cr interlayer deposited by HiPIMS in Ti-6Al-4V alloy

Página do item simplificado
dc.citation.volume309
dc.contributor.authorSugahara, Tarcila [UNIFESP]
dc.contributor.authorMartins, Gislene Valdete
dc.contributor.authorMontoro, Fabiano Emmanuel
dc.contributor.authorMerij Neto, Abrao [UNIFESP]
dc.contributor.authorMassi, Marcos [UNIFESP]
dc.contributor.authorda Silva Sobrinho, Argemiro Soares
dc.contributor.authorPereira Reis, Danieli Aparecida [UNIFESP]
dc.coverageLausanne
dc.date.accessioned2020-07-17T14:03:14Z
dc.date.available2020-07-17T14:03:14Z
dc.date.issued2017
dc.description.abstractThis paper presents a study about creep behavior of SiC thin films with Cr interlayer deposited by High Power Impulse Magnetron Sputtering (HiPIMS) on Ti-6Al-4V alloys with Widmanstatten microstructure. After SiC/Cr film depositions, a microstructural characterization was performed using Scratching Test, Scanning Electron Microscopy (SEM), Scanning and Transmission Electron Microscopy (STEM), and Energy Dispersive Spectroscopy (EDS) techniques. Scratching tests showed that the film was well adhered to the substrate, which proves that the Cr interlayer is closely related to the strength of adhesion between SiC film and the substrate. The SiC film surface morphology has columnar shape according to STEM images. Creep test results were compared with earlier Ti-6Al-4V Widmanstatten microstructure studies, and they showed an increased lifetime for the Ti-6Al-4V Widmanstatten microstructure with SiC/Cr film, which indicates a higher creep resistance than the specimen without the SiC/Cr film. The SiC/Cr film deposited by HiPIMS improved the creep behavior of the Ti-6Al-4V Widmanstatten microstructure. (C) 2016 Elsevier B.V. All rights reserved.en
dc.description.affiliationUniv Fed Sao Paulo, ICT Unifesp, Sao Paulo, Brazil
dc.description.affiliationInst Tecnol Aeronaut, ITA DCTA, Sao Jose Dos Campos, Brazil
dc.description.affiliationLNNano CNPEM, Lab Nacl Nanotecnol, Campinas, SP, Brazil
dc.description.affiliationUniv Prebiteriana Mackenzie, Sch Engn PPGEMN, Sao Paulo, SP, Brazil
dc.description.affiliationUnifespUniv Fed Sao Paulo, ICT Unifesp, Sao Paulo, Brazil
dc.description.sourceWeb of Science
dc.description.sponsorshipCAPES
dc.format.extent410-416
dc.identifierhttp://dx.doi.org/10.1016/j.surfcoat.2016.11.091
dc.identifier.citationSurface & Coatings Technology. Lausanne, v. 309, p. 410-416, 2017.
dc.identifier.doi10.1016/j.surfcoat.2016.11.091
dc.identifier.issn0257-8972
dc.identifier.urihttps://repositorio.unifesp.br/handle/11600/55246
dc.identifier.wosWOS:000396184400048
dc.language.isoeng
dc.publisherElsevier Science Sa
dc.relation.ispartofSurface & Coatings Technology
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.subjectSiCen
dc.subjectTi-6Al-4Ven
dc.subjectHiPIMSen
dc.subjectMicrostructural characterizationen
dc.subjectCreepen
dc.titleCreep behavior evaluation and characterization of SiC film with Cr interlayer deposited by HiPIMS in Ti-6Al-4V alloyen
dc.typeinfo:eu-repo/semantics/article
Arquivos
Coleções
ICT - Artigos