Influence of Domain Switching and Domain Wall Bending on the Electrical Permittivity of PZT Thin Films
| dc.contributor.author | Lente, Manuel Henrique [UNIFESP] | |
| dc.contributor.author | Bacichetti, Antonio Leondino | |
| dc.contributor.author | Mendes, Renata Gonçalves | |
| dc.contributor.author | Eiras, Jose Antonio | |
| dc.contributor.institution | Universidade Federal de São Paulo (UNIFESP) | |
| dc.contributor.institution | Universidade Federal de São Carlos (UFSCar) | |
| dc.date.accessioned | 2016-01-24T14:06:00Z | |
| dc.date.available | 2016-01-24T14:06:00Z | |
| dc.date.issued | 2011-01-01 | |
| dc.description.abstract | The electrical permittivity dependence on the electric bias field was investigated in Pb(Zr-0.53, Ti-0.47)O-3 films. the results revealed the existence of two mechanisms contributing to the permittivity. the first one was related to the domain switching, which was responsible for a strong nonlinear dielectric response. the second mechanism was associated with the non-180 degrees domain wall vibrations, which presented a reasonable linear electrical behavior with the applied field, contributing always to the permittivity independently of the poling state of the sample. the reduction of the electrical permittivity with increasing the bias field was related to the bending of non-180 degrees domain walls. | en |
| dc.description.affiliation | Universidade Federal de São Paulo, Dept Ciencia & Tecnol, BR-12231280 Sao Jose Dos Campos, SP, Brazil | |
| dc.description.affiliation | Univ Fed Sao Carlos, Dept Fis, Grp Ceram Ferroeletr, BR-13565670 Sao Carlos, SP, Brazil | |
| dc.description.affiliationUnifesp | Universidade Federal de São Paulo, Dept Ciencia & Tecnol, BR-12231280 Sao Jose Dos Campos, SP, Brazil | |
| dc.description.source | Web of Science | |
| dc.format.extent | 11-15 | |
| dc.identifier | https://dx.doi.org/10.1080/00150193.2010.486254 | |
| dc.identifier.citation | Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 410, p. 11-15, 2011. | |
| dc.identifier.doi | 10.1080/00150193.2010.486254 | |
| dc.identifier.issn | 0015-0193 | |
| dc.identifier.uri | https://repositorio.unifesp.br/handle/11600/33305 | |
| dc.identifier.wos | WOS:000286529300003 | |
| dc.language.iso | eng | |
| dc.publisher | Taylor & Francis Ltd | |
| dc.relation.ispartof | Ferroelectrics | |
| dc.rights | info:eu-repo/semantics/restrictedAccess | |
| dc.rights.license | http://journalauthors.tandf.co.uk/permissions/reusingOwnWork.asp | |
| dc.subject | Ferroelectrics | en |
| dc.subject | Domain walls | en |
| dc.subject | Permittivity | en |
| dc.subject | PZT | en |
| dc.subject | Thin films | en |
| dc.title | Influence of Domain Switching and Domain Wall Bending on the Electrical Permittivity of PZT Thin Films | en |
| dc.type | info:eu-repo/semantics/article |