Please use this identifier to cite or link to this item: https://repositorio.unifesp.br/handle/11600/36741
Title: Micropulse Diode Laser Treatment for Chronic Central Serous Chorioretinopathy: A Randomized Pilot Trial
Authors: Roisman, Luiz [UNIFESP]
Magalhaes, Fernanda Pedreira [UNIFESP]
Lavinsky, Daniel [UNIFESP]
Moraes, Nilva [UNIFESP]
Hirai, Flavio E. [UNIFESP]
Cardillo, Jose Augusto [UNIFESP]
Farah, Michel Eid [UNIFESP]
Universidade Federal de São Paulo (UNIFESP)
Araraquara Eye Hosp
Issue Date: 1-Sep-2013
Publisher: Slack Inc
Citation: Ophthalmic Surgery Lasers & Imaging Retina. Thorofare: Slack Inc, v. 44, n. 5, p. 465-470, 2013.
Abstract: BACKGROUND and OBJECTIVE: To evaluate 810-nm subthreshold diode micropulse (SDM) laser in patients with chronic central serous chorioretinopathy (CSC).PATIENTS and METHODS: Prospective, randomized, double-blind, sham- controlled pilot trial. Patients were randomized to SDM laser treatment (group 1) or sham procedure (group 2). Primary outcome measure was change in best corrected visual acuity (BCVA); secondary outcome was central macular thickness after 3 months. Laser treatment was performed along the detached area. At the 3-month visit, all patients were evaluated for re-treatment if they met re-treatment criteria.RESULTS: Fifteen patients were included in this study: five patients in the sham group and 10 in the treatment group. At 3 months, BCVA was significantly enhanced in the treatment group (P = .006) compared with the sham group (P = .498). All patients from the sham group needed treatment after 3 months. An improvement in central macular thickness and leakage on fluorescein angiography was noted in all treated patients (in both groups).CONCLUSION: in this limited-size, short-term exploratory study, SDM laser was effective in treating chronic CSC. There was no evidence of retinal damage induced by treatment.
URI: http://repositorio.unifesp.br/handle/11600/36741
ISSN: 2325-8160
Other Identifiers: http://dx.doi.org/10.3928/23258160-20130909-08
Appears in Collections:Em verificação - Geral

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