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Title: Structural validity and reliability of the Positive and Negative Affect Schedule (PANAS): Evidence from a large Brazilian community sample
Authors: Carvalho, Hudson W. de
Andreoli, Sergio B. [UNIFESP]
Lara, Diogo R.
Patrick, Christopher J.
Quintana, Maria Ines [UNIFESP]
Bressan, Rodrigo A. [UNIFESP]
Melo, Marcelo F. de [UNIFESP]
Mari, Jair de J. [UNIFESP]
Jorge, Miguel R. [UNIFESP]
Universidade Federal de Pernambuco (UFPE)
Universidade Federal de São Paulo (UNIFESP)
Univ Catolica Santos
Pontificia Univ Catolica Rio Grande Sul PUCRS
Florida State Univ
Keywords: Emotion
structural equation modeling
Positive and Negative Affect Schedule
Issue Date: 1-Apr-2013
Publisher: Assoc Brasileira Psiquiatria
Citation: Revista Brasileira de Psiquiatria. São Paulo: Assoc Brasileira Psiquiatria, v. 35, n. 2, p. 169-172, 2013.
Abstract: Objective: Positive and negative affect are the two psychobiological-dispositional dimensions reflecting proneness to positive and negative activation that influence the extent to which individuals experience life events as joyful or as distressful. the Positive and Negative Affect Schedule (PANAS) is a structured questionnaire that provides independent indexes of positive and negative affect. This study aimed to validate a Brazilian interview-version of the PANAS by means of factor and internal consistency analysis.Methods: A representative community sample of 3,728 individuals residing in the cities of São Paulo and Rio de Janeiro, Brazil, voluntarily completed the PANAS. Exploratory structural equation model analysis was based on maximum likelihood estimation and reliability was calculated via Cronbach's alpha coefficient.Results: Our results provide support for the hypothesis that the PANAS reliably measures two distinct dimensions of positive and negative affect.Conclusion: the structure and reliability of the Brazilian version of the PANAS are consistent with those of its original version. Taken together, these results attest the validity of the Brazilian adaptation of the instrument.
ISSN: 1516-4446
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